tests: Update sequential cutoff tests

Signed-off-by: Robert Baldyga <robert.baldyga@intel.com>
This commit is contained in:
Robert Baldyga
2021-02-15 20:46:15 +01:00
parent 3ee253cc4e
commit 9352c881ab
3 changed files with 7 additions and 3 deletions

View File

@@ -45,6 +45,7 @@ class CoreConfig(Structure):
("_volume_type", c_uint8),
("_try_add", c_bool),
("_seq_cutoff_threshold", c_uint32),
("_seq_cutoff_promotion_count", c_uint32),
("_user_metadata", UserMetadata),
]
@@ -52,6 +53,7 @@ class CoreConfig(Structure):
class Core:
DEFAULT_ID = 4096
DEFAULT_SEQ_CUTOFF_THRESHOLD = 1024 * 1024
DEFAULT_SEQ_CUTOFF_PROMOTION_COUNT = 8
def __init__(
self,
@@ -59,6 +61,7 @@ class Core:
try_add: bool,
name: str = "core",
seq_cutoff_threshold: int = DEFAULT_SEQ_CUTOFF_THRESHOLD,
seq_cutoff_promotion_count: int = DEFAULT_SEQ_CUTOFF_PROMOTION_COUNT,
):
self.cache = None
self.device = device
@@ -76,6 +79,7 @@ class Core:
_volume_type=self.device.type_id,
_try_add=try_add,
_seq_cutoff_threshold=seq_cutoff_threshold,
_seq_cutoff_promotion_count=seq_cutoff_promotion_count,
_user_metadata=UserMetadata(_data=None, _size=0),
)