From b8ccf403f03db6663e35d49969258937c88c83d5 Mon Sep 17 00:00:00 2001 From: Kamil Gierszewski Date: Wed, 6 Nov 2024 13:57:36 +0100 Subject: [PATCH] test-conftest: Kill IO faster in prepare/teardown Signed-off-by: Kamil Gierszewski --- test/functional/tests/conftest.py | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) diff --git a/test/functional/tests/conftest.py b/test/functional/tests/conftest.py index 3b09be4..410b99c 100644 --- a/test/functional/tests/conftest.py +++ b/test/functional/tests/conftest.py @@ -142,7 +142,7 @@ def base_prepare(item): with TestRun.LOGGER.step("Cleanup before test"): TestRun.executor.run("pkill --signal=SIGKILL fsck") Udev.enable() - kill_all_io() + kill_all_io(graceful=False) DeviceMapper.remove_all() if installer.check_if_installed(): @@ -223,7 +223,7 @@ def pytest_runtest_teardown(): if not TestRun.executor.is_active(): TestRun.executor.wait_for_connection() Udev.enable() - kill_all_io() + kill_all_io(graceful=False) unmount_cas_devices() if installer.check_if_installed():